Selected Publications and Patents:
2024:
- Jingli Gao, Mengya Zhang,Li Ma,Miao Huang, Zhen Li,
A segmentation network based on residual blocks and multi-channel images,
2024 3rd International Conference on Image Processing and Media Computing , 2024. - Jingli Gao, Mengya Zhang,Li Ma,Miao Huang, Zhen Li,
A unified binary classification network for weld image detection,
2023 8th International Conference on Control, Robotics and Cybernetics , 2023. - Rui Chen, Jianwei Zhang, Zhifeng Zhang, Yanshuo Chang, Jingli Gao, Pu Li, and Hui Liang,
A comprehensive social matrix factorization for recommendations with prediction and feedback mechanisms by fusing trust relationships and social tags,
Soft Computing , vol. 26, pp. 11479-11496, 2022. - Bingkun Wang, Donghong Shan, Aiwan Fan, Lei Liu, and Jingli Gao*,
A Sentiment Classification Method of Web Social Media Based on Multi-dimension and Multi-level Modeling,
IEEE Transactions on Industrial Informatics , vol. 18, no. 2, pp. 1240-1249, 2022. (* corresponding author) - Jingli Gao, Chenglin Wen, and Meiqin Liu,
Robust Small Target Co-Detection from Airborne Infrared Image Sequences,
Sensors , 2017. - Jingli Gao, Chenglin Wen, and Meiqin Liu,
A two-layer detection model for infrared slow lowaltitude targets,
中国自动化大会 , 2017. - Jingli Gao, Chenglin Wen, Zhejing Bao, and Meiqin Liu.,
Detecting slowly moving infrared targets using temporal filtering and association strategy,
Frontiers of Information Technology & Electronic Engineering , 2016.
[----Project Page----] - 高敬礼, 文成林, 刘妹琴,
基于奇异值分解和叠加法的慢速小目标检测算法,
上海交通大学学报 , 2015.
2014:
- Jingli Gao, Chenglin Wen, and Meiqin Liu,
Steel surface defect detection and localization based on SVD and two-side compressive measurements,
The 26th Chinese Control and Decision Conference (CCDC) , 2014. - Jingli Gao, Chenglin Wen, and Meiqin Liu,
SVD-based scattered small targets detection,
International Conference on Multisensor Fusion and Information Integration for Intelligent Systems , 2014.
- Jingli Gao, Chenglin Wen, and Meiqin Liu,
Steel surface defect detection and localization based on SVD and two-side compressive measurements,